2024 SIRI’s new research project: collaboration with Intifar in Taiwan and PromiseQ in Germany – AI-based image behavior solutions for automatic detection in Semiconductor Packaging Industry!
新論文發表於 IEEE TCPMT!
A new paper published on IEEE TCPMT: Investigation of Creep Failure in Ag-4Pd Bonding Wire Under Dynamic Mechanical Analysis Tests
歡迎各界人士、國內外同學加入 陳俊豪 老師的 System Integration & Reliable Interconnects Lab!
Welcome everyone and international students to join Prof. Chen’s System Integration & Reliable Interconnects Lab!
陳俊豪 老師加入 陽明交大國際半導體產業學院!
Prof. Chen is in International College of Semiconductor Technology, NYCU!
Research Focus
Electronic Packaging: Microelectronics & Power electronics
Interconnection Technologies of Power Electronic Packaging for Electric Vehicles and Photovoltaic Systems
針對電動車、光伏系統用高功率半導體元件與模組封裝技術,SIRI實驗室對電動車功率模組內功率晶片面與晶背接合技術,舉凡SiC, GaN, Si IGBT均有研究題目
IGBT & Power MOSFET (SiC) Power Module Packaging
1 Top-side interconnects: large dimension heavy wire bonding up to 500 µm 2 Back-side interconnects: cost-effective silver sintering technology
Interfacial Reaction and Joining Technology of Metal Materials
金屬材料界面反應與接合技術
Material damage and failure analysis
材料破損與失效分析
Top-Side and Back-Side Interconnection Technology
Top-side connections, like wire bonding, enable compact designs and efficient heat dissipation. Back-side interconnections, such as silver sintering, offers better thermal properties and reliability, enhancing the performance of the overall packaging system. The choice between these technologies impacts device size, power efficiency, and overall functionality. Efficient top-side and back-side interconnections are crucial for thermal and power management in the high-power system. Striking the right balance ensures optimal performance and reliability in modern power electronic devices.
Reliability of Power Electronic Packaging for Electric Vehicles
Reliability tests on power electronic packages are crucial for ensuring the durability and safety of electronic devices. These tests assess the package’s ability to withstand various stressors such as temperature fluctuations, mechanical shocks, and electrical overloads. By subjecting packages to rigorous conditions, we can identify potential weaknesses and failure before they impact the end product. This enhances the reliability of electronic devices by delivering products that perform consistently under diverse and harsh operating conditions.
Active Power Cycling Test
Heat Management and Packaging on Power GaN HEMT Devices
Research on advanced packaging and heat management for High Power Gallium Nitride (GaN) High Electron Mobility Transistor (HEMT) devices is critical due to the rising demand for high-power electronics across various sectors. GaN HEMT devices offer significant advantages including high-power density, efficiency, and frequency operation. However, their operation generates substantial heat that can compromise performance and reliability if not managed effectively. Thus, integrating these GaN HEMT devices into multiple subsystems with advanced packaging techniques and efficient heat management strategies is vital. This project aims to develop innovative packaging solutions and thermal management techniques to ensure optimal performance and reliability of high-power GaN HEMT devices in applications such as power electronics, RF amplifiers, and wireless communication systems.
AI image verification & validation on packaging components
AI transforms electronic packaging assembly lines by automating optical inspection, predicting maintenance needs, and expediting root cause analysis. Automated optical inspection systems with machine learning algorithms detect minute defects, ensuring higher quality. Predictive maintenance reduces downtime by anticipating equipment failures. AI’s adaptive learning continually improves accuracy. Challenges include infrastructure investment and data privacy considerations. This topic aims to achieve the goal of integrating AI to have intelligent assembly lines, enhancing both operational excellence and product quality.
Microelectronics
Wire bonding reliability analysis
EBSD analysis on ultra-fine Ag-alloy wire, interpreting stage manner of electromigration mechanism